Panel Discussion: How do we validate patent metrics derived from semantic analysis?

There has been an explosion of development of semantic-based measures seeking to capture similarity across patents; novelty; disruptiveness, value or impact, etc. The panel will bring together researchers who’ve been working on these metrics to discuss questions such as: what is the relationship of these metrics to older ones based on, e.g., patent classification or citations; how should validation be structured (should people validate their own measures or should we try to create some kind of shared or over-arching validation process); what is the relationship between different modes of validation (e.g. correlation with exiting metrics, testing against subjective expert judgements, correlation with outcome indicators such as productivity or prizes)

Moderator: Bronwyn Hall, Stanford University and NBER (TBC)
Sam Arts, KU Leuven (slides)
Dokyun Lee, Boston University (slides)
Ina Ganguli, University of Massachusetts Amherst (slides)
Josh Lerner, Harvard University and NBER (slides)